A characterization technique for quantum well infrared photodetectors
نویسندگان
چکیده
Despite the rapid development of the quantum well ~QW! infrared technology, the intrinsic properties of the QW infrared photodetectors ~QWIPs! have not been directly measured under the operating conditions of the detector. In this work, we introduce a characterization technique, which utilizes the surface corrugation to probe the absorption coefficient and the photoconductive gain of a QWIP under different operating conditions. This technique enables the intrinsic properties of the detector to be more accurately characterized and its performance better assessed. A mid-wavelength QWIP is used for the demonstration of this technique. The results are compared to those deduced from the conventional measurements. © 1999 American Institute of Physics. @S0003-6951~99!02246-9#
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